8inch Silicon wafer P/N-mhando (100) 1-100Ω dummy reclaim substrate

Tsanangudzo Pfupi

Yakakura heta yeaviri mativi akakwenenzverwa mawafers, ese mawafer kubva pa50 kusvika 400mm mudhayamita Kana tsananguro yako isingawanikwe mune yedu hesiti, takagadzira hukama hwenguva refu nevazhinji vatengesi vanokwanisa kugadzira mawafers kuti akwane chero yakasarudzika yakasarudzika.Kaviri-mativi akakwenenzverwa wafers anogona kushandiswa silicon, girazi uye zvimwe zvinhu zvinowanzoshandiswa mu semiconductor indasitiri.


Product Detail

Product Tags

Sumo yewafer box

Iyo 8-inch silicon wafer inowanzoshandiswa silicon substrate zvinhu uye inoshandiswa zvakanyanya mukugadzira maitiro emasekete akabatanidzwa.Masilicon wafers akadaro anowanzo shandiswa kugadzira marudzi akasiyana-siyana emagetsi akabatanidzwa, anosanganisira microprocessors, memory chips, sensors uye zvimwe zvigadzirwa zvemagetsi.8-inch silicon wafers anowanzo shandiswa kugadzira machipisi akakura saizi, aine zvakanakira zvinosanganisira yakakura pamusoro penzvimbo uye kugona kugadzira mamwe machipisi pane imwechete silicon wafer, zvichitungamira mukuwedzera kugadzirwa kwakanaka.Iyo 8-inch silicon wafer inewo yakanaka mechanic uye makemikari zvimiro, iyo yakakodzera kune yakakura-yakabatanidzwa yedunhu kugadzirwa.

Product features

8" P/N mhando, yakaposheswa silicon wafer (25 pcs)

Nhamba: 200

Resistivity: 0.1 - 40 ohm•cm (Inogona kusiyana kubva pabatch kuenda pabatch)

Ukobvu: 725+/-20um

Prime/Monitor/Test Grade

ZVINHU ZVINHU

Parameter Hunhu
Type/Dopant P, Boron N, Phosphorous N, Antimony N, Arsenic
Orientations <100>, <111> cheka mirairidzo pane zvakatemwa nemutengi
Oxygen Content 1019ppmA Tsika kushivirira pane zvakatemwa nemutengi
Carbon Content <0.6 ppmA

MACHHANICAL PROPERTIES

Parameter Prime Monitor/ Muedzo A Test
Diameter 200±0.2mm 200 ± 0.2mm 200 ± 0.5 mm
Ukobvu 725±20µm (yakajairwa) 725±25µm(yakajairwa) 450±25µm

625±25µm

1000±25µm

1300±25µm

1500±25µm

725±50µm (yakajairwa)
TTV <5 µm <10µm <15µm
Bow <30µm <30µm <50µm
Wrap <30µm <30µm <50µm
Edge Rounding SEMI-STD
Kumaka Primary SEMI-Flat chete, SEMI-STD Flats Jeida Flat, Notch
Parameter Prime Monitor/ Muedzo A Test
Front Side Criteria
Surface condition Chemical Mechanical Yakanatswa Chemical Mechanical Yakanatswa Chemical Mechanical Yakanatswa
Kukasharara Kwepamusoro < 2 A° < 2 A° < 2 A°
Kusvibiswa

Zvimedu@ >0.3 µm

= 20 = 20 = 30
Haze, Makomba

Orange peel

Hapana Hapana Hapana
Maona, Marks

Striations

Hapana Hapana Hapana
Back Side Criteria
Kutsemuka, makumbo emakungu, mavanga esaha, mavara Hapana Hapana Hapana
Surface condition Caustic etched

Detailed Diagram

IMG_1463 (1)
IMG_1463 (2)
IMG_1463 (3)

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