8Inch 200mm 4H-N SiC Wafer Conductive dummy research giredhi

Tsanangudzo Pfupi

Sezvo zvekufambisa, simba uye misika yemaindasitiri inoshanduka, kudiwa kweakavimbika, epamusoro pekuita magetsi emagetsi anoramba achikura.Kuti isangane nezvinodiwa zvekuvandudzwa semiconductor kuita, vagadziri vemidziyo vari kutarisa kune yakakura bandgap semiconductor zvinhu, seyedu 4H SiC Prime Giredhi portfolio ye4H n -type silicon carbide (SiC) mawafers.


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Nekuda kwekusiyana kwayo kwemuviri uye zvemagetsi zvivakwa, 200mm SiC wafer semiconductor zvinhu zvinoshandiswa kugadzira yakakwirira-inoshanda, yakakwirira-tembiricha, inodzivirira mwaranzi, uye yakakwirira-frequency zvigadzirwa zvemagetsi.8inch SiC substrate mutengo uri kudzikira zvishoma nezvishoma sezvo tekinoroji inowedzera uye kudiwa kuri kukura.Zvichangobva kuitika tekinoroji zvinotungamira mukugadzirwa kwehukuru hwe200mm SiC wafers.Iwo mabhenefiti makuru eSiC wafer semiconductor zvinhu mukuenzanisa neSi neGaAs wafers: Iyo yemagetsi munda simba re4H-SiC panguva yekuputsika kweavalanche inopfuura hurongwa hwehukuru hwepamusoro kupfuura hunoenderana kukosha kweSi neGaAs.Izvi zvinotungamira kudzikira kwakakosha mune-nyika resistivity Ron.Yakaderera pa-state resistivity, yakasanganiswa nepamusoro-soro density uye yekupisa conductivity, inobvumira kushandiswa kwekufa kudiki kwemagetsi emagetsi.Iyo yakakwira yekupisa conductivity yeSiC inoderedza kupisa kwekupisa kwechip.Iyo yemagetsi zvimiro zvemidziyo yakavakirwa eSiC wafers yakagadzikana zvakanyanya nekufamba kwenguva uye pane tembiricha yakagadzikana, iyo inovimbisa kuvimbika kwakanyanya kwezvigadzirwa.Silicon carbide inopesana zvakanyanya neradiation yakaoma, iyo isingaderedze zvinhu zvemagetsi zvechip.Iyo yakanyanya kudzikisira tembiricha yekushandisa yekristaro (inopfuura 6000C) inokutendera iwe kuti ugadzire yakavimbika michina yemamiriro ekushanda akaomarara uye yakakosha maapplication.Parizvino, isu tinokwanisa kupa diki batch 200mmSiC wafers zvakatsiga uye nekuenderera uye nekuva nezvimwe stock mudura.

Tsanangudzo

Number Item Unit Kugadzirwa Tsvakurudzo Dummy
1. Parameters
1.1 polytype -- 4H 4H 4H
1.2 pamusoro pekutarisa ° <11-20>4±0.5 <11-20>4±0.5 <11-20>4±0.5
2. Magetsi parameter
2.1 dopant -- n-mhando Nitrogen n-mhando Nitrogen n-mhando Nitrogen
2.2 resistivity uyo ·cm 0.015~0.025 0.01~0.03 NA
3. Mechanical parameter
3.1 dhayamita mm 200±0.2 200±0.2 200±0.2
3.2 ukobvu μm 500±25 500±25 500±25
3.3 Notch orientation ° [1- 100]±5 [1- 100]±5 [1- 100]±5
3.4 Notch Depth mm 1~1.5 1~1.5 1~1.5
3.5 LTV μm ≤5(10mm*10mm) ≤5(10mm*10mm) ≤10(10mm*10mm)
3.6 TTV μm ≤10 ≤10 ≤15
3.7 Bow μm -25~25 -45~45 -65~65
3.8 Warp μm ≤30 ≤50 ≤70
3.9 AFM nm Ra≤0.2 Ra≤0.2 Ra≤0.2
4. Chimiro
4.1 micropipe density e/cm2 ≤2 ≤10 ≤50
4.2 metal content maatomu/cm2 ≤1E11 ≤1E11 NA
4.3 TSD e/cm2 ≤500 ≤1000 NA
4.4 BPD e/cm2 ≤2000 ≤5000 NA
4.5 TED e/cm2 ≤7000 ≤10000 NA
5. Hunhu hwakanaka
5.1 pamberi -- Si Si Si
5.2 pamusoro pekupedzisira -- Si-face CMP Si-face CMP Si-face CMP
5.3 particle ea/wafer ≤100(saizi≥0.3μm) NA NA
5.4 scratch ea/wafer ≤5, Hurefu Hwose≤200mm NA NA
5.5 Edge
chips/indents/cracks/stains/contamination
-- Hapana Hapana NA
5.6 Polytype nzvimbo -- Hapana Nzvimbo ≤10% Nzvimbo ≤30%
5.7 pamberi pemaka -- Hapana Hapana Hapana
6. Back quality
6.1 back finish -- C-chiso MP C-chiso MP C-chiso MP
6.2 scratch mm NA NA NA
6.3 Back defects kumucheto
machipisi/indents
-- Hapana Hapana NA
6.4 Back roughness nm Ra≤5 Ra≤5 Ra≤5
6.5 Kumaka kumashure -- Notch Notch Notch
7. Mupendero
7.1 kumucheto -- Chamfer Chamfer Chamfer
8. Package
8.1 kurongedza -- Epi-yakagadzirira ne vacuum
kurongedza
Epi-yakagadzirira ne vacuum
kurongedza
Epi-yakagadzirira ne vacuum
kurongedza
8.2 kurongedza -- Multi-wafer
kurongedza makaseti
Multi-wafer
kurongedza makaseti
Multi-wafer
kurongedza makaseti

Detailed Diagram

8inch SiC03
8inch SiC4
8inch SiC5
8inch SiC6

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