8inch Silicon wafer P/N-mhando (100) 1-100Ω dummy reclaim substrate

Tsanangudzo Pfupi:

Yakakura heta yeaviri mativi akakwenenzverwa mawafers, ese mawafer kubva pa50 kusvika 400mm mudhayamita Kana tsananguro yako isingawanikwe mune yedu hesiti, takagadzira hukama hwenguva refu nevazhinji vatengesi vanokwanisa kugadzira mawafers kuti akwane chero yakasarudzika yakasarudzika. Kaviri-mativi akakwenenzverwa wafers anogona kushandiswa silicon, girazi uye zvimwe zvinhu zvinowanzo shandiswa muindasitiri yesemiconductor.

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Product Detail

Product Tags

Sumo yewafer box

Iyo 8-inch silicon wafer inowanzoshandiswa silicon substrate zvinhu uye inoshandiswa zvakanyanya mukugadzira maitiro emasekete akabatanidzwa. Masilicon wafers akadaro anowanzo shandiswa kugadzira marudzi akasiyana-siyana emagetsi akabatanidzwa, anosanganisira microprocessors, memory chips, sensors uye zvimwe zvigadzirwa zvemagetsi. 8-inch silicon wafers anowanzo shandiswa kugadzira machipisi akakura saizi, aine zvakanakira zvinosanganisira yakakura pamusoro penzvimbo uye kugona kugadzira mamwe machipisi pane imwechete silicon wafer, zvichitungamira mukuwedzera kugadzirwa kwakanaka. Iyo 8-inch silicon wafer inewo yakanaka mechanic uye makemikari zvimiro, iyo yakakodzera kune yakakura-yakabatanidzwa yedunhu kugadzirwa.

Product features

8" P/N mhando, yakaposheswa silicon wafer (25 pcs)

Nhamba: 200

Resistivity: 0.1 - 40 ohm•cm (Inogona kusiyana kubva pabatch kuenda pabatch)

Ukobvu: 725+/-20um

Prime/Monitor/Test Grade

ZVINHU ZVINHU

Parameter	Hunhu
Type/Dopant	P, Boron N, Phosphorous N, Antimony N, Arsenic
Orientations	<100>, <111> cheka nhanho zvichienderana nezvinodiwa nemutengi
Oxygen Content	10¹⁹ppmA Tsika kushivirira pane zvakatemwa nemutengi
Carbon Content	<0.6 ppmA

MACHHANICAL PROPERTIES

Parameter	Prime	Monitor/ Muedzo A	Test
Diameter	200±0.2mm	200 ± 0.2mm	200 ± 0.5 mm
Ukobvu	725±20µm (yakajairwa)	725±25µm(yakajairika) 450±25µm 625±25µm 1000±25µm 1300±25µm 1500±25µm	725±50µm (yakajairwa)
TTV	<5 µm	<10µm	<15µm
Bow	<30µm	<30µm	<50µm
Wrap	<30µm	<30µm	<50µm
Edge Rounding	SEMI-STD
Kumaka	Primary SEMI-Flat chete, SEMI-STD Flats Jeida Flat, Notch

Parameter	Prime	Monitor/ Muedzo A	Test
Front Side Criteria
Surface condition	Chemical Mechanical Yakanatswa	Chemical Mechanical Yakanatswa	Chemical Mechanical Yakanatswa
Kukasharara Kwepamusoro	< 2 A°	< 2 A°	< 2 A°
Kusvibiswa Zvimedu@ >0.3 µm	= 20	= 20	= 30
Haze, Makomba Orange peel	Hapana	Hapana	Hapana
Maona, Marks Striations	Hapana	Hapana	Hapana
Back Side Criteria
Kutsemuka, makumbo emakumbo, mavanga esaha, mavara	Hapana	Hapana	Hapana
Surface condition	Caustic etched